Effects of sputtering power on the properties of ZnO:Ga films deposited by r.f. magnetron-sputtering at low temperature

被引:152
作者
Yu, XH
Ma, J [1 ]
Ji, F
Wang, YH
Zhang, XJ
Cheng, CF
Ma, HL
机构
[1] Shandong Univ, Sch Phys & Microelect, Jinan 250100, Peoples R China
[2] Shandong Normal Univ, Dept Phys, Jinan 250014, Peoples R China
关键词
magnetron sputtering; ZnO : Ga films; electrical and optical properties;
D O I
10.1016/j.jcrysgro.2004.10.037
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Gallium-doped zinc oxide (ZnO:Ga) films were prepared oil glass substrates by r.f. magnetron sputtering Lit low substrate temperature. Structural, electrical and optical properties of the ZnO:Ga films were investigated in terms of the preparation conditions. The obtained films were polycrystalline with a hexagonal wurtzite structure and preferentially oriented in the (0 0 2) crystallographic direction. The transmittance of the ZnO:Ga films in the visible range was over 85%,,. The lowest resistivity and sheet resistance for the ZnO:Ga films were about 3.9 x 10(-4) Omegacm and 4.6Omega/square, respectively. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:474 / 479
页数:6
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