Surface charge of silica determined using X-ray photoelectron spectroscopy

被引:9
作者
Cardenas, JF [1 ]
机构
[1] Umea Univ, S-90187 Umea, Sweden
关键词
surface charge; silica; electrolyte; XPS; titration;
D O I
10.1016/j.colsurfa.2004.10.085
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Here an approach to determine absolute surface charge densities of powder solid samples in an inert electrolyte solution using X-ray photoelectron spectroscopy (XPS) is presented. The surface charge due to the potential determining ions was obtained by determining the surface densities, using XPS, of the counterions and co-ions that were taken up by the solid from an electrolyte solution. The approach is demonstrated using results for dispersions consisted of SiO2 colloids in 20 mM NaCl and 100 mM KCI electrolyte solutions with a pH between similar to9 and similar to2. The work has shown that the surface charge density determined by XPS is in good agreement with potentiometric titration experiments in the pH interval investigated, where the former technique may provide constraints for determining unambiguously the absolute surface charge density. (C) 2004 Published by Elsevier B.V.
引用
收藏
页码:213 / 219
页数:7
相关论文
共 29 条
[1]   BEHAVIOR OF A PYROGENIC SILICA IN SIMPLE ELECTROLYTES [J].
ABENDROTH, RP .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1970, 34 (04) :591-+
[2]  
[Anonymous], ADSORPTION INORGANIC
[3]   Ion pair formation and primary charging behavior of titanium oxide (anatase and rutile) [J].
Bourikas, K ;
Hiemstra, T ;
Van Riemsdijk, WH .
LANGMUIR, 2001, 17 (03) :749-756
[4]   Investigation of the titaniumdioxide-aqueous solution interface using XPS and cryogenics [J].
Cardenas, J ;
Sjöberg, S .
SURFACE SCIENCE, 2003, 532 :1104-1108
[5]   Biomedical surface science: Foundations to frontiers [J].
Castner, DG ;
Ratner, BD .
SURFACE SCIENCE, 2002, 500 (1-3) :28-60
[6]  
DOVE PM, 1994, REV MINERAL, V29, P259
[7]   Evidence of the existence of three types of species at the quartz-aqueous solution interface at pH 0-10: XPS surface group quantification and surface complexation modeling [J].
Duval, Y ;
Mielczarski, JA ;
Pokrovsky, OS ;
Mielczarski, E ;
Ehrhardt, JJ .
JOURNAL OF PHYSICAL CHEMISTRY B, 2002, 106 (11) :2937-2945
[8]  
Fadley C. S., 1976, Progress in Solid State Chemistry, V11, P265, DOI 10.1016/0079-6786(76)90013-3
[9]   SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
FADLEY, CS ;
BAIRD, RJ ;
SIEKHAUS, W ;
NOVAKOV, T ;
BERGSTROM, SA .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 4 (02) :93-137
[10]  
Foissy A, 1998, SURFACE PROPERTIES OF SILICAS, P365