Phase-sensitive imaging and phase tomography using X-ray interferometers

被引：244

作者：

Momose, A ^{[1
]}

机构：

[1] Univ Tokyo, Grad Sch Frontier Sci, Dept Adv Mat Sci, Bunkyo Ku, Tokyo 1130033, Japan

来源：

OPTICS EXPRESS | 2003年 / 11卷 / 19期

关键词：

D O I：

10.1364/OE.11.002303

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

X-ray interferometry for imaging applications is discussed with a review of X-ray interferometric imaging activities reported to date. Phase measurement and phase tomography based on X-ray interferometry are also presented. Finally the advantage of X-ray interferometric imaging in comparison with other phase-sensitive X-ray imaging methods is discussed. (C) 2003 Optical Society of America

引用

页码：2303 / 2314

页数：12

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