Explanation of low critical currents in flat, bulk versus meandering, thin-film [001] tilt bicrystal grain boundaries in YBa2Cu3O7

被引：47

作者：

Gray, KE ^{[1
]}

Field, MB ^{[1
]}

Miller, DJ ^{[1
]}

机构：

[1] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA

来源：

PHYSICAL REVIEW B | 1998年 / 58卷 / 14期

关键词：

D O I：

10.1103/PhysRevB.58.9543

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Thin-film and bulk [001] tilt, bicrystal grain boundaries in YBa2Cu3O7 exhibit a strong dependence of critical current density on misorientation angle. What is particularly difficult to understand is its thirty times lower magnitude in bulk grain boundaries which are microscopically more perfect, i.e., flatter, minimally faceted, and free of impurity phases. A plausible explanation, based on differences of the pinning of Josephson vortices in these grain boundary types, is proposed here. [S0163-1829(98)05438-1].

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页码：9543 / 9548

页数：6

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