The absolute hole injection efficiency from pre-treated indium tin oxide electrodes into poly(9,9-dioctylfluorene) and its copolymers

被引:1
作者
Campbell, AJ [1 ]
Bradley, DDC [1 ]
Antoniadis, H [1 ]
机构
[1] Univ Sheffield, Dept Phys & Astron, Sheffield S3 7RH, S Yorkshire, England
来源
ORGANIC LIGHT-EMITTING MATERIALS AND DEVICES IV | 2000年 / 4105卷
关键词
electroluminescent polymers; indium-tin-oxide; light emitting diodes; injection; charge carrier mobility;
D O I
10.1117/12.416896
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
If conduction in a polymer light emitting diode is by trap-free, space-charge-limited current (TFSCLC), the injecting contact must be ohmic. Such an ohmic contact is, by definition, the perfect injecting electrode. The absolute injection efficiency of any specific contact can therefore be quantified by the ratio of the actual current density, J, to that of the ideal TFSCLC current density, J(TFSCLC). In this work we report on the injection efficiency of positive carriers from pretreated indium tin oxide (ITO) and metal electrodes into poly(9,9-dioctylfluorene) (PFO) and two representative copolymers. The ITO was either washed only in solvents, exposed to an oxygen plasma or coated in a film of poly(ethylenedioxythiophene)/polystyrenesulphonic acid blend. Time-of-flight photocurrent measurements were used to find the positive carrier mobility, mu (p), so that J(TFSCLC) could be calculated. Dark injection current transient measurements were used to confirm the presence or absence of TFSCLC conduction. Steady-state, current density-voltage measurements were then used to compare the actual current to J(TFSCLC), thus allowing the absolute injection efficiency, J/J(TFSCLC), to be calculated.
引用
收藏
页码:215 / 230
页数:16
相关论文
共 43 条
[41]  
Scott JC, 1999, J IMAGING SCI TECHN, V43, P233
[42]   Dependence of indium-tin-oxide work function on surface cleaning method as studied by ultraviolet and x-ray photoemission spectroscopies [J].
Sugiyama, K ;
Ishii, H ;
Ouchi, Y ;
Seki, K .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (01) :295-298
[43]  
UMBACH E, 1998, INTERNAL REPORT U WU