Spalling of Cu6Sn5 spheroids in the soldering reaction of eutectic SnPb on Cr/Cu/Au thin films

被引:125
作者
Liu, AA [1 ]
Kim, HK [1 ]
Tu, KN [1 ]
Totta, PA [1 ]
机构
[1] IBM CORP,E FISHKILL FACIL,HOPEWELL JCT,NY 12533
关键词
D O I
10.1063/1.363728
中图分类号
O59 [应用物理学];
学科分类号
摘要
The growth and morphology of intermetallic compounds between the solder and substrate play an important role in the solderability and reliability of electronic solder joints. Solder on thin films, as in chip joint, acts as an electrical and mechanical/physical interconnection between the chip and the substrate. We have studied the interfacial reactions between eutectic SnPb (63Sn37Pb, wt%) and Cr/Cu/Au thin films. Our results found here have been compared to the solder reaction on bulk Cu. The eutectic solder has 7 degrees of wetting angle on Cr/Cu/Au thin films rather than 11 degrees on Cu substrate, Sideband around the solder cap was found in both the thin film case and the Cu case. Spalling of Cu6Sn5 compound grains occurred in the thin-film case when the Cu film was consumed but not in the case of bulk Cu. We observed a shape change from hemispherical ''scallops'' to spheroids before spalling took place. The shape change is assisted by ripening a reaction among the scallops. We have calculated a critical size of the scallop. depending on the Cu film thickness, when the shape change or spalling starts. (C) 1996 American Institute of Physics.
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页码:2774 / 2780
页数:7
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