Specular and diffuse reflectivity from thin films containing misfit dislocations

被引：40

作者：

Miceli, PF ^{[1
]}

Weatherwax, J ^{[1
]}

Krentsel, T ^{[1
]}

Palmstrom, CJ ^{[1
]}

机构：

[1] UNIV MINNESOTA,DEPT CHEM ENGN & MAT SCI,MINNEAPOLIS,MN 55455

来源：

PHYSICA B | 1996年 / 221卷 / 1-4期

关键词：

D O I：

10.1016/0921-4526(95)00930-2

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We discuss the effects of misfit dislocations on the specular and diffuse scattering observed in X-ray reflectivity at the Bragg reflections of thin films. Using experimental results from ErAs/GaAs(0 0 1), it is shown that an interfacial displacement-difference correlation function can be used to model the scattering from misfit dislocations. We find that the diffuse scattering is correlation-length-limited for weak disorder whereas it has a rotational character for strong disorder. It is suggested that the correlation length arises from the elastic image field of a misfit dislocation.

引用

页码：230 / 234

页数：5

共 19 条

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