Experimental study of coexistence issues between IEEE 802.11b and IEEE 802.15.4 wireless networks

被引:130
作者
Angrisani, Leopoldo [1 ]
Bertocco, Matteo [2 ]
Fortin, Daniele [2 ]
Sona, Alessandro [2 ]
机构
[1] Univ Naples Federico II, Dept Comp Sci & Control Syst, I-80125 Naples, Italy
[2] Univ Padua, Dept Informat Engn, I-35131 Padua, Italy
关键词
IEEE; 802.11b; 802.15.4; packet loss ratio (PLR); signal-to-interference ratio (SIR); wireless local area network (WLAN); wireless sensor network (WSN);
D O I
10.1109/TIM.2008.925346
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Coexistence issues between IEEE 802.11b wireless communication networks and IEEE 802.15.4 wireless sensor networks, operating over the 2.4-GHz industrial, scientific, and medical band, are assessed. In particular, meaningful experiments that are performed through a suitable testbed are presented. Such experiments involve both the physical layer, through measurements of channel power and the SIR, and the network/transport layer, by means of packet loss ratio estimations. Different configurations of the testbed are considered; major characteristics, such as the packet rate, the packet size, the SIR, and the network topology, are varied. The purpose of this paper is to gain helpful information and hints to efficiently face coexistence problems between such networks and optimize their setup in some real-life conditions. Details concerning the testbed, the measurement procedure, and the performed experiments are provided.
引用
收藏
页码:1514 / 1523
页数:10
相关论文
共 14 条
[11]   IEEE 802.11b performance analysis in the presence of IEEE 802.15.4 interference [J].
Myoung, Kwan-Joo ;
Shin, Soo-Young ;
Park, Hong-Seong ;
Kwon, Wook-Hyun .
IEICE TRANSACTIONS ON COMMUNICATIONS, 2007, E90B (01) :176-179
[12]  
Shin SY, 2005, LECT NOTES COMPUT SC, V3510, P279
[13]   Experimental evaluation of an industrial application layer protocol over wireless systems [J].
Vitturi, Stefano ;
Carreras, Lacopo ;
Miorandi, Daniele ;
Schenato, Luca ;
Sona, Alessandro .
IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2007, 3 (04) :275-288
[14]  
YOON DG, 2006, KP VEH TECHN C MAY 7, V3, P1186