The dynamic response of a hot-wire anemometer: III. Voltage-perturbation versus velocity-perturbation testing for near-wall hot-wire/film probes

被引:21
作者
Khoo, BC [1 ]
Chew, YT [1 ]
Teo, CJ [1 ]
Lim, CP [1 ]
机构
[1] Natl Univ Singapore, Dept Mech & Prod Engn, Singapore 119260, Singapore
关键词
dynamic response; square-wave test; near-wall hot wire; flush-mounted hot wire; hot-film wall shear-stress gauge;
D O I
10.1088/0957-0233/10/3/009
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Experiments were performed for the first time using the electronic square-wave voltage-perturbation test to systematically quantify the frequency response (fs) of near-wall hot-wire probes subjected in turn to varying magnitudes of convective velocity, different substrate materials and changes in wall-substrate temperature. In addition, quartz-substrate hot-film gauges with various thicknesses of quartz coating were also tested. Results of fs were compared against the dynamic frequency response (f(D)) previously obtained in parts I and II using a known near-wall fluctuating flow field. Although the observed trends for fD and fs were similar, their magnitudes were vastly different, notably for the commercially available hot-film gauges, or which fs was up to five orders of magnitude greater than fD. This signifies that there are possibly inherent differences between square-wave voltage-perturbation and velocity-perturbation tests for quantifying the frequency response of a hot-wire/hot-film system. These differences are then analysed in relation to the equation of a CTA unit put forth by Freymuth.
引用
收藏
页码:152 / 169
页数:18
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