Directional wavelets revisited: Cauchy wavelets and symmetry detection in patterns

被引：74

作者：

Antoine, JP ^{[1
]}

Murenzi, R

Vandergheynst, P

机构：

[1] Univ Catholique Louvain, Inst Phys Theor, B-1348 Louvain, Belgium

[2] Clark Atlanta Univ, CTSPS, Atlanta, GA 30314 USA

[3] Clark Atlanta Univ, Dept Phys, Atlanta, GA 30314 USA

来源：

APPLIED AND COMPUTATIONAL HARMONIC ANALYSIS | 1999年 / 6卷 / 03期

关键词：

D O I：

10.1006/acha.1998.0255

中图分类号：

O29 [应用数学];

学科分类号：

070104 ;

摘要：

The analysis of oriented features in images requires two-dimensional directional wavelets. Among these, we study in detail the class of Cauchy wavelets, which are strictly supported in a (narrow) convex cone in spatial frequency space. They have excellent angular selectivity, as shown by a standard calibration test, and they have minimal uncertainty. In addition, we present a new application of directional wavelets, namely a technique for determining the symmetries of a given pattern with respect to rotations and dilation. (C) 1999 Academic Press.

引用

页码：314 / 345

页数：32

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