4d Photoionization of free singly charged xenon ions

被引：26

作者：

Gottwald, A

Gerth, C

Richter, M

机构：

[1] Tech Univ Berlin, Inst Atomare & Analyt Phys, D-10623 Berlin, Germany

[2] BESSY, PTB, D-14195 Berlin, Germany

来源：

PHYSICAL REVIEW LETTERS | 1999年 / 82卷 / 10期

关键词：

D O I：

10.1103/PhysRevLett.82.2068

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Electron spectroscopy in direct 4d photoionization of free Xe+ ions has been realized for the first time, applying various timing and coincidence techniques to suppress and to monitor on line the strong fluctuating background. The ionization energies of 4d(5/2) and 4d(3/2) electrons of Xe+(5p(5) P-2(3/2)) and Xe+(5p(5) P-2(1/2)) were determined and compared to calculated RHF(CI) values and to corresponding results of neutral Xe(5p(6) S-1(0)) atoms to study the influence of the outer-shell electron occupation on the 4d(-1) inner-shell process.

引用

页码：2068 / 2070

页数：3

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