A theoretical model for Schottky diodes for excluding the sneak current in cross bar array resistive memory

被引:43
作者
Kim, Gun Hwan
Kim, Kyung Min
Seok, Jun Yeong
Lee, Hyun Ju
Cho, Deok-Yong
Han, Jeong Hwan
Hwang, Cheol Seong [1 ]
机构
[1] Seoul Natl Univ, Dept Mat Sci & Engn, WCU Hybrid Mat Program, Seoul 151744, South Korea
关键词
DENSITY NONVOLATILE MEMORY;
D O I
10.1088/0957-4484/21/38/385202
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Kirchhoff's law was used to examine the electrical specifications of selection diodes, which are essential for suppressing the read interference problems in nano-scale resistive switching cross bar arrays with a high block density. The diode in the cross bar array with a 100 Mb block density should have a reverse/forward resistance ratio of > 10(8), and a forward current density of > 10(5) A cm(-2) for stable reading and writing operation. Whilst normal circuit simulators are heavily overloaded when the number of cells (m) connected to one bit and word line is larger (m >> 100), which is the desired range for high density cross bar arrays, the present model can provide a simple simulation. The validity of this new method was confirmed by a comparison with the previously reported method based on a voltage estimation.
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页数:7
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