Oriented zeolite MFI monolayer films on metal substrates by in situ crystallization

被引：95

作者：

Wang, ZB ^{[1
]}

Yan, YS ^{[1
]}

机构：

[1] Univ Calif Riverside, Dept Chem & Environm Engn, Riverside, CA 92521 USA

来源：

MICROPOROUS AND MESOPOROUS MATERIALS | 2001年 / 48卷 / 1-3期

关键词：

zeolite; thin film; orientation; metal substrate; in situ crystallization;

D O I：

10.1016/S1387-1811(01)00357-2

中图分类号：

O69 [应用化学];

学科分类号：

081704 ;

摘要：

Continuous b-oriented zeolite MFI monolayer films (<0.4 pm thick) were prepared by in situ crystallization on metal substrates (stainless steel and aluminum alloy) using a synthesis solution 0.32TPAOH:TEOS:165H(2)O (TPAOH: tetra-propylammonium hydroxide, TEOS: tetraethylorthosilicate). Effects of crystallization temperature and time, surface roughness, position and chemical nature of the substrate, and aging time of the synthesis solution were investigated and a mechanism for the b-oriented monolayer thin film formation was discussed. The supported films were characterized with scanning electron microscopy and X-ray diffraction. Polishing of the film with a normal lab polisher leads to a continuous ultrathin zeolite film with a surface roughness less than 0.05 mum. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：229 / 238

页数：10

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