A megahertz nanomechanical resonator with room temperature quality factor over a million

被引:177
作者
Verbridge, Scott S. [1 ]
Craighead, Harold G. [2 ,3 ]
Parpia, Jeevak M. [1 ,3 ]
机构
[1] Cornell Univ, Dept Phys, Ithaca, NY 14853 USA
[2] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA
[3] Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA
关键词
D O I
10.1063/1.2822406
中图分类号
O59 [应用物理学];
学科分类号
摘要
We demonstrate the fabrication and operation of high aspect ratio tensile stressed silicon nitride string resonators. We explore the parameter space of small cross sections, on the order of 100 nm, and long lengths up to 325 mu m, demonstrating that such high aspect ratio resonators can be made with standard wet release processing using a material with internal tensile stress. Room temperature quality factors exceed one million at frequencies above 1 MHz. The utility of such high quality factor flexural resonators to probe the interaction of high frequency nanoscale devices with rarefied gases is demonstrated. (C) 2008 American Institute of Physics.
引用
收藏
页数:3
相关论文
共 31 条
[1]   Laser annealing for high-Q MEMS resonators [J].
Aubin, KL ;
Zalalutdinov, M ;
Reichenbach, RB ;
Houston, B ;
Zehnder, AT ;
Parpia, JM ;
Craighead, HG .
SMART SENSORS, ACTUATORS, AND MEMS, PTS 1 AND 2, 2003, 5116 :531-535
[2]   Effect of fluids on the Q factor and resonance frequency of oscillating micrometer and nanometer scale beams -: art. no. 036307 [J].
Bhiladvala, RB ;
Wang, ZJ .
PHYSICAL REVIEW E, 2004, 69 (03) :036307-1
[3]   Silicon resonant microcantilevers for absolute pressure measurement [J].
Bianco, S. ;
Cocuzza, M. ;
Ferrero, S. ;
Giuri, E. ;
Piacenza, G. ;
Pirri, C. F. ;
Ricci, A. ;
Scaltrito, L. ;
Bich, D. ;
Merialdo, A. ;
Schina, P. ;
Correale, R. .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2006, 24 (04) :1803-1809
[4]  
BLOM F, 1992, J VAC SCI TECHNOL B, V10
[5]  
Braginsky V.B., 1985, SYSTEMS SMALL DISSIP, P10
[6]   Strain- and pressure-dependent RF response of microelectromechanical resonators for sensing applications [J].
Brueckner, K. ;
Cimalla, V. ;
Niebelschuetz, F. ;
Stephan, R. ;
Tonisch, K. ;
Ambacher, O. ;
Hein, M. A. .
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2007, 17 (10) :2016-2023
[7]   Electromechanical resonators from graphene sheets [J].
Bunch, J. Scott ;
van der Zande, Arend M. ;
Verbridge, Scott S. ;
Frank, Ian W. ;
Tanenbaum, David M. ;
Parpia, Jeevak M. ;
Craighead, Harold G. ;
McEuen, Paul L. .
SCIENCE, 2007, 315 (5811) :490-493
[8]   Measurement of mechanical resonance and losses in nanometer scale silicon wires [J].
Carr, DW ;
Evoy, S ;
Sekaric, L ;
Craighead, HG ;
Parpia, JM .
APPLIED PHYSICS LETTERS, 1999, 75 (07) :920-922
[9]   A nanometre-scale mechanical electrometer [J].
Cleland, AN ;
Roukes, ML .
NATURE, 1998, 392 (6672) :160-162
[10]   Nanoelectromechanical systems [J].
Craighead, HG .
SCIENCE, 2000, 290 (5496) :1532-1535