Output-relevant fault reconstruction based on Total PLS

被引:2
作者
Li, Gang [1 ]
Zhou, Donghua [1 ]
Qin, S. Joe [2 ,3 ]
机构
[1] Tsinghua Univ, Dept Automat, TNList, Beijing 100084, Peoples R China
[2] Univ So Calif, Dept Chem Engn & Mat Sci, Los Angeles, CA 90089 USA
[3] Univ So Calif, Dept Elect Engn, Los Angeles, CA 90089 USA
来源
2010 8TH WORLD CONGRESS ON INTELLIGENT CONTROL AND AUTOMATION (WCICA) | 2010年
关键词
output-relevant fault detection; total PLS; fault reconstruction; fault estimation; PRINCIPAL COMPONENT ANALYSIS; IDENTIFICATION; DIAGNOSIS;
D O I
10.1109/WCICA.2010.5554642
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Process monitoring is critical for efficient operations of industrial processes. When a fault occurs, relevant measured data are affected by the fault, which leads to poor quality of products consequently. This paper proposes a new output-relevant index for detecting faults that affect the output or quality, and studies the fault detectability based on total projection to latent structures (T-PLS). Given a fault subspace, fault-free data are reconstructed and the fault magnitude is estimated based on the new index. A simulation example is used to show the effectiveness of the proposed methods.
引用
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页码:1718 / 1722
页数:5
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