Structure of Ti4AlN3 -: a layered Mn+1AXn nitride

被引：113

作者：

Rawn, CJ

Barsoum, MW

El-Raghy, T

Procipio, A

Hoffmann, CM

Hubbard, CR

机构：

[1] Oak Ridge Natl Lab, Div Met & Ceram, Oak Ridge, TN 37831 USA

[2] Drexel Univ, Dept Mat Engn, Philadelphia, PA 19104 USA

来源：

MATERIALS RESEARCH BULLETIN | 2000年 / 35卷 / 11期

基金：

美国国家科学基金会;

关键词：

nitrides; X-ray diffraction (XRD); neutron scattering; crystal structure;

D O I：

10.1016/S0025-5408(00)00383-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Recent high resolution transmission electron microscopy and electron probe X-ray microanalysis show that the compound originally thought to be Ti3Al2N2 is Ti4AlN3. In this paper we report on the crystal structure determination by Rietveld refinement on neutron and X-ray powder diffraction data. Ti4AlN3 crystallizes with a hexagonal unit cell, space group P6(3)/mmc, and with lattice parameters a = 2.9880(2) and c = 23.372(2) Angstrom. The stacking sequence is such that every four layers of Ti atoms is separated by a layer of Al atoms. The N atoms occupy octahedral sites between the Ti atoms making up a network of corner shared octahedra. This compound is closely related to other layered, ternary, machinable, hexagonal nitrides and carbides, namely, M2AX and M3AX2, where M is an early transition metal, A is a A-group element and X is either C and/or N. (C) 2000 Elsevier Science Ltd. All rights reserved.

引用

页码：1785 / 1796

页数：12

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