Local structural properties in the terahertz semiconductor Zn1-xCdxTe

被引:8
作者
Han, SW [1 ]
机构
[1] Lawrence Berkeley Lab, Chem Sci Div, Berkeley, CA 94720 USA
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2003年 / 42卷 / 10期
关键词
ZnCdTe; terahertz; local structure; disorder; XAFS; semiconductor;
D O I
10.1143/JJAP.42.6303
中图分类号
O59 [应用物理学];
学科分类号
摘要
Local structural properties of wide-band-gap semiconductors, Zn1-xCdxTe (ZCT) crystals (x = 0-0.25), were studied using X-ray absorption fine structure (XAFS) measurements at the Te L-1 - and Zn K-edges. A previous study by Liu et al. (1)) reported that ZCT emits or absorbs terahertz (THz) signals with a best efficiency when x similar or equal to 0.05. The XAFS studies show that the disorder and the bond length of Te-Zn pairs have maximum values at about x = 0.05. We discuss that these structural transitions are relevant to the efficiency of THz emission and absorption in ZCT crystals. We also find that the distance of Te-Cd pairs is at least similar to0.2 Angstrom longer than that of Te-Zn pairs and that Cd doping causes disorder/distortion in both Te and Zn sites in the crystals.
引用
收藏
页码:6303 / 6307
页数:5
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