Residual macroscopic stress in highly preferentially oriented titanium nitride coatings deposited on various steel types

被引:22
作者
Quaeyhaegens, C
Knuyt, G
Stals, LM
机构
[1] Institute for Materials Research, Materials Physics Division, Limburgs Universitair Centrum
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1996年 / 14卷 / 04期
关键词
D O I
10.1116/1.580037
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The residual macroscopic stresses present in 1.5-mu m-thick TiN coatings on martensitic hot work tool steel and austenitic stainless steel are studied with a Theta-2 Theta decoupled x-ray diffractometer using glancing angle x-ray diffraction optics. All coatings exhibit a preferential orientation which complicates the interpretation of the conventional sin(2) Psi method. To overcome this complication, a method is used, called the fixed crystal orientation (FCO) sin(2) Psi method, in order to determine the mechanical stress in the presence of a symmetrically distributed preferential orientation. It is shown that in contrast to the glancing angle sin(2) Psi method and the conventional sin(2) Psi method interpretational problems resulting from elastic incompatibility can be avoided using the FCO method. In the TiN coatings studied a biaxial stress state can be assumed and different stress values are measured depending on the preferential orientation and the substrate material. The stress values obtained with the FCO sin(2) Psi method for the different samples are compared with the stress values obtained using the glancing angle sin(2) Psi method and the conventional sin(2) Psi method. (C) 1996 American Vacuum Society.
引用
收藏
页码:2462 / 2469
页数:8
相关论文
共 16 条
[1]  
ANDREWS KW, 1971, IMTERPRETATION ELECT
[2]   X-RAY-MEASUREMENT OF RESIDUAL-STRESSES IN TEXTURED THIN COATINGS [J].
DEBUYSER, L ;
VANHOUTTE, P ;
AERNOUDT, E .
TEXTURES AND MICROSTRUCTURES, 1991, 14 :73-78
[3]  
Delhez R., 1987, Surface Engineering, V3, P331
[4]   INFLUENCE OF MULTIAXIAL STRESS STATES, STRESS GRADIENTS AND ELASTIC-ANISOTROPY ON THE EVALUATION OF (RESIDUAL) STRESSES BY X-RAYS [J].
DOLLE, H .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1979, 12 (DEC) :489-501
[5]   RESIDUAL-STRESS AND X-RAY ELASTIC-CONSTANTS IN HIGHLY TEXTURED PHYSICALLY VAPOR-DEPOSITED COATINGS [J].
FILLIT, RY ;
PERRY, AJ .
SURFACE & COATINGS TECHNOLOGY, 1988, 36 (3-4) :647-659
[6]  
FILLIT RY, 1987, Patent No. 845009545
[7]   X-RAY-DIFFRACTION DETERMINATION OF THE EFFECT OF VARIOUS PASSIVATIONS ON STRESS IN METAL-FILMS AND PATTERNED LINES [J].
FLINN, PA ;
CHIANG, C .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (06) :2927-2931
[8]   DIRECTED SPUTTER-DEPOSITION OF ALCU - FILM MICROSTRUCTURE AND MICROCHEMISTRY [J].
KIM, YW ;
MOSER, J ;
PETROV, I ;
GREENE, JE ;
ROSSNAGEL, SM .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (06) :3169-3175
[9]   LATTICE-PARAMETER OF NONSTOICHIOMETRIC COMPOUND TINX [J].
NAGAKURA, S ;
KUSUNOKI, T ;
KAKIMOTO, F ;
HIROTSU, Y .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (FEB1) :65-66
[10]  
Noyan I.C., 1987, Residual Stress-Measurement by Diffraction and Interpretation, V1st