Influence of substrate temperature and sputtering atmosphere on electrical and optical properties of double silver layer systems

被引:76
作者
Klöppel, A [1 ]
Meyer, B [1 ]
Trube, J [1 ]
机构
[1] Appl Films, D-63755 Alzenau, Germany
关键词
coatings; deposition process; resistance; optical properties;
D O I
10.1016/S0040-6090(01)01049-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A new method for the preparation of double silver layer systems with ultra-low resistance and high visible transmittance for use as low-emissivity (low -E) coatings, low resistance transparent electrodes for display applications and also electromagnetic interference (EMI) shieldings in plasma display panel (PDP) applications has been successfully developed. in this paper, the results of an optimization of the deposition conditions of both oxide layers and metallic layers using indium-tin oxide (ITO) and indium-cerium oxide (ICO) as transparent oxides and a silver alloy as a metallic layer are illustrated. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:311 / 314
页数:4
相关论文
共 6 条
[1]   ITO/Ag/ITO multilayer films for the application of a very low resistance transparent electrode [J].
Choi, KH ;
Kim, JY ;
Lee, YS ;
Kim, HJ .
THIN SOLID FILMS, 1999, 341 (1-2) :152-155
[2]   Dependence of the electrical and optical behaviour of ITO-silver-ITO multilayers on the silver properties [J].
Klöppel, A ;
Kriegseis, W ;
Meyer, BK ;
Scharmann, A ;
Daube, C ;
Stollenwerk, J ;
Trube, J .
THIN SOLID FILMS, 2000, 365 (01) :139-146
[3]   THERMAL-STABILITY OF HEAT-REFLECTIVE FILMS CONSISTING OF OXIDE-AG-OXIDE DEPOSITED BY DC MAGNETRON SPUTTERING [J].
KUSANO, E ;
KAWAGUCHI, J ;
ENJOUJI, K .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (06) :2907-2910
[4]   ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES [J].
MAYADAS, AF ;
SHATZKES, M .
PHYSICAL REVIEW B, 1970, 1 (04) :1382-&
[5]   New low emissivity coating based on TwinMag® sputtered TiO2 and Si3N4 layers [J].
Szczyrbowski, J ;
Bräuer, G ;
Ruske, M ;
Schilling, H ;
Zmelty, A .
THIN SOLID FILMS, 1999, 351 (1-2) :254-259
[6]   DC CONDUCTIVITY IN POLYCRYSTALLINE METALS FOR BULK AND THIN-FILM SAMPLES [J].
SZCZYRBOWSKI, J ;
SCHMALZBAUER, K .
JOURNAL OF PHYSICS F-METAL PHYSICS, 1986, 16 (12) :2079-2098