Analysis of write-head synchronization and adjacent track erasure in bit patterned media using a statistical model

An analysis of the performance of a bit patterned media data storage system composed of nanoscale islands with variations in position and magnetic properties has been carried out. The statistical model of write errors includes adjacent track erasure and error rates are computed according to the down-track synchronization of the write head switching position and cross-track head position variations. Two-dimensional maps of bit error rates reveal that distributions of position and anisotropy have a severe impact on the performance of the system. Results show that head field cross-track gradients needs to be tightly controlled to minimize the effects of adjacent track erasure. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3562869]