On matrix effects in HF-plasma-SNMS analysis of sintered ceramic Ti-Al-(Si)-O

被引：3

作者：

Borner, H

Jenett, H

Hodoroaba, VD

机构：

[1] Univ Leipzig, Fak Phys & Geowissensch, D-04103 Leipzig, Germany

[2] Inst Spektrochem & Angew Spektroskopie, D-44013 Dortmund, Germany

[3] Univ Al I Cuza, Fac Fiz, RO-6600 Iasi, Romania

来源：

FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1998年 / 361卷 / 6-7期

关键词：

D O I：

10.1007/s002160050958

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

For a series of electrically non-conductive, sintered ceramic samples with the nominal composition Si-0.05(AlxTi1-x)(0.95)O-y (x being varied from 0 to 1 in steps of Delta x = 0.1), the influences of elemental concentration and of the sputtering frequency in the plasma-SNMS high frequency mode on relative sensitivity factors were investigated. For Al and Ti they show strong matrix effects which may arise from the emission of positive secondary ions.

引用

页码：590 / 591

页数：2

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