Sub-angstrom structure characterisation: The Brite-Euram route towards one angstrom

被引:66
作者
VanDyck, D
Lichte, H
vanderMast, KD
机构
[1] TECH UNIV DRESDEN, INST ANGEW PHYS, D-01062 DRESDEN, GERMANY
[2] PHILIPS ELECTRON OPT BV, NL-5600 MD EINDHOVEN, NETHERLANDS
关键词
D O I
10.1016/0304-3991(96)00057-5
中图分类号
TH742 [显微镜];
学科分类号
摘要
Rather than pushing the point resolution of the electron microscope below 1 Angstrom by increasing the voltage above 1 MeV, we have adopted a different route in which we push down the information limit and retrieve the information by image processing. This goal has now been achieved by using a coherent electron source and optimizing the lens design and the detector configuration and the alignment procedure. The phase is recovered by two different holographic methods: sideband holography and focus variation, whereas for the object structure retrieval, a new method has been developed to ''reverse'' in a sense the dynamical scattering in the object.
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页码:1 / 15
页数:15
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