PHASE RETRIEVAL THROUGH FOCUS VARIATION FOR ULTRA-RESOLUTION IN FIELD-EMISSION TRANSMISSION ELECTRON-MICROSCOPY

被引：326

作者：

COENE, W ^{[1
]}

JANSSEN, G ^{[1
]}

DEBEECK, MO ^{[1
]}

VANDYCK, D ^{[1
]}

机构：

[1] UNIV ANTWERP,EMAT,B-2020 ANTWERP,BELGIUM

来源：

PHYSICAL REVIEW LETTERS | 1992年 / 69卷 / 26期

关键词：

D O I：

10.1103/PhysRevLett.69.3743

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The use of a coherent field-emission electron source in transmission electron microscopy is combined with phase retrieval by digital processing of a focal image series. For the first time, a dramatic improvement of the high-resolution performance of the electron microscope beyond the usual ''point-to-point'' resolution has been realized: Experiments on a 200-kV microscope with a point resolution of 0.24 nm reveal reconstructed information down to 0.14 nm. Examples are shown in the field of high-T(c) superconductors and ferroelectric oxides. The oxygen sublattice in these structures is revealed.

引用

页码：3743 / 3746

页数：4

共 17 条

[1] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SEMICONDUCTORS AND METALS [J].