HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SEMICONDUCTORS AND METALS

被引：4

作者：

BULLELIEUWMA, CWT

COENE, W

DEJONG, AF

机构：

[1] Philips Research Laboratories, Eindhoven, NL-5600 JA

来源：

ADVANCED MATERIALS | 1991年 / 3卷 / 7-8期

关键词：

D O I：

10.1002/adma.19910030708

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Review: Two-dimensional information on the microstructure of materials at a resolution comparable to interatomic distances is crucial for the study of interfaces, defects, growth mechanisms etc. One of the most important analytical methods for gaining such information is high-resolution electron microscopy (HREM). The interpretation of the results on semiconductors, magnetic alloys and multilayers, can often be facilitated through image processing and simulation.

引用

页码：368 / 378

页数：11

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