Measurement of interaction forces between silica and alpha-alumina by atomic force microscopy

被引:114
作者
Veeramasuneni, S [1 ]
Yalamanchili, MR [1 ]
Miller, JD [1 ]
机构
[1] UNIV UTAH,COLL MINES & EARTH SCI,DEPT MET ENGN,SALT LAKE CITY,UT 84112
关键词
electrostatic forces; aggregation; dispersion; point of zero charge; atomic force microscopy; silica; alumina;
D O I
10.1006/jcis.1996.0656
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Interaction forces between a silica sphere and an alpha-alumina substrate at various pH values were measured by atomic force microscopy (AFM). As expected, at pH values of 10.8 and 10.2 when the surfaces are similarly charged, a repulsive force was observed. On the other hand, at pH values of 5.5, 6.4, and 8.6 when the surfaces sue oppositely charged, attractive forces mere observed, Experimental force vs separation distance curves were found to be in good agreement with theoretical predictions based on electrostatic and van der Waals interactions. Interestingly, when the force/radius values at a particular separation distance were plotted against pH, the transition from an attractive to a repulsive force occurred at pH 9.3, which is very close to the point of zero charge (pzc) of alpha-alumina as determined from electrophoresis experiments. These results suggest that AFM force measurements can be used to estimate the pzc of materials. This method may be of particular significance for soluble salt minerals where conventional electrophoretic measurements are not possible at high ionic strengths. Finally, results from transmittance studies further confirmed the interaction between silica and alpha alumina particles in suspensions at various pH values as would be expected based on the results from atomic force microscopy measurements. (C) 1996 Academic Press, Inc.
引用
收藏
页码:594 / 600
页数:7
相关论文
共 29 条
[1]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[2]   PROBING THE SURFACE FORCES OF MONOLAYER FILMS WITH AN ATOMIC-FORCE MICROSCOPE [J].
BURNHAM, NA ;
DOMINGUEZ, DD ;
MOWERY, RL ;
COLTON, RJ .
PHYSICAL REVIEW LETTERS, 1990, 64 (16) :1931-1934
[3]   ELECTROSTATIC INTERACTION IN ATOMIC FORCE MICROSCOPY [J].
BUTT, HJ .
BIOPHYSICAL JOURNAL, 1991, 60 (04) :777-785
[4]   MEASURING ELECTROSTATIC, VANDERWAALS, AND HYDRATION FORCES IN ELECTROLYTE-SOLUTIONS WITH AN ATOMIC FORCE MICROSCOPE [J].
BUTT, HJ .
BIOPHYSICAL JOURNAL, 1991, 60 (06) :1438-1444
[5]   Analysis of friction and adhesion IV The theory of the adhesion of small particles [J].
Derjaguin, B .
KOLLOID-ZEITSCHRIFT, 1934, 69 (02) :155-164
[6]   DIRECT MEASUREMENT OF MOLECULAR FORCES [J].
DERJAGUIN, BV ;
RABINOVICH, YI ;
CHURAEV, NV .
NATURE, 1978, 272 (5651) :313-318
[7]   DIRECT MEASUREMENT OF COLLOIDAL FORCES USING AN ATOMIC FORCE MICROSCOPE [J].
DUCKER, WA ;
SENDEN, TJ ;
PASHLEY, RM .
NATURE, 1991, 353 (6341) :239-241
[8]   RAPID MEASUREMENT OF STATIC AND DYNAMIC SURFACE FORCES [J].
DUCKER, WA ;
COOK, RF .
APPLIED PHYSICS LETTERS, 1990, 56 (24) :2408-2410
[9]  
FUERSTENAU MC, 1985, CHEMFLOTATION
[10]   FLOTATION MECHANISMS OF BORON MINERALS [J].
HANCER, M ;
CELIK, MS .
SEPARATION SCIENCE AND TECHNOLOGY, 1993, 28 (09) :1703-1714