A critical evaluation of the effective diffusion length determination in crystalline silicon solar cells from an extended spectral analysis

被引：7

作者：

Keller, S ^{[1
]}

Spiegel, M ^{[1
]}

Fath, P ^{[1
]}

Willeke, GP ^{[1
]}

Bucher, E ^{[1
]}

机构：

[1] Univ Konstanz, Fac Phys, D-78457 Konstanz, Germany

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1998年 / 45卷 / 07期

关键词：

measurement errors; modeling; photovoltaic cells; silicon; spectral analysis;

D O I：

10.1109/16.701490

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This note draws attention to possible errors when characterizing silicon solar cells by means of the effective minority carrier diffusion length L-eff as defined in the paper on "Numerical modeling of textured silicon solar cells using PC1D" by Basore [1]. The approximations underlying the analytical expression for L-eff are critically reviewed. Their impact on the determination of the minority carrier bulk diffusion length L-b from L-eff is discussed for a 250-mu m thick Si solar cell. It is found that considerable errors occur in the case of diffusion lengths larger than the cell thickness even when neglecting any measurement uncertainty.

引用

页码：1569 / 1574

页数：6

共 13 条

[1]

[Anonymous], P 23 IEEE PHOT SPEC

[2] NUMERICAL MODELING OF TEXTURED SILICON SOLAR-CELLS USING PC-1D [J].