Time-resolved X-ray diffraction study of C60 at high pressure and temperature

被引：24

作者：

Horikawa, T ^{[1
]}

Suito, K ^{[1
]}

Kobayashi, M ^{[1
]}

Onodera, A ^{[1
]}

机构：

[1] Osaka Univ, Grad Sch Engn Sci, Toyonaka, Osaka 5608531, Japan

来源：

PHYSICS LETTERS A | 2001年 / 287卷 / 1-2期

关键词：

fullerene; high pressure; X-ray diffraction;

D O I：

10.1016/S0375-9601(01)00345-0

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Energy-dispersive X-ray diffraction measurements on C-60 were undertaken at every 1-10 min interval while high temperature (200-800 degreesC) was held constant for at longest 3 h under pressures of 12.5 and 14.3 GPa. The results from this and additional experiments have provided an insight into the time, pressure, and temperature dependency of the fullerene-derived superhard materials. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：143 / 151

页数：9