Investigation of the Casimir force between metal and semiconductor test bodies

被引：81

作者：

Chen, F ^{[1
]}

Mohideen, U

Klimchitskaya, GL

Mostepanenko, VM

机构：

[1] Univ Calif Riverside, Dept Phys, Riverside, CA 92521 USA

[2] NW Tech Univ, St Petersburg 191065, Russia

[3] Noncommercial Partnership Sci Instruments, Moscow 103905, Russia

来源：

PHYSICAL REVIEW A | 2005年 / 72卷 / 02期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1103/PhysRevA.72.020101

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The measurement of the Casimir force between a large gold coated sphere and single crystal silicon plate is performed with an atomic force microscope. A rigorous statistical comparison of data with theory is done, without use of the concept of root-mean-square deviation, and excellent agreement is obtained. The Casimir force between metal and semiconductor is demonstrated to be qualitatively different than between two similar or dissimilar metals, which opens opportunities for applications in nanotechnology.

引用

页数：4

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