Phase-sensitive neutron reflectometry measurements applied in the study of photovoltaic films

被引：43

作者：

Kiel, J. W. ^{[1
,2
]}

Mackay, M. E. ^{[1
]}

Kirby, B. J. ^{[3
]}

Maranville, B. B. ^{[3
]}

Majkrzak, C. F. ^{[3
]}

机构：

[1] Univ Delaware, Dept Mat Sci & Engn, Newark, DE 19716 USA

[2] Michigan State Univ, Dept Chem Engn & Mat Sci, E Lansing, MI 48824 USA

[3] Natl Inst Stand & Technol, Ctr Neutron Scattering, Gaithersburg, MD 20899 USA

来源：

JOURNAL OF CHEMICAL PHYSICS | 2010年 / 133卷 / 07期

关键词：

POLYMER; MORPHOLOGY; POLY(3-HEXYLTHIOPHENE); ORGANIZATION; DIFFUSION;

D O I：

10.1063/1.3471583

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Due to low charge carrier mobilities in polymer-based solar cells, device performance is dictated by the nanoscale morphology of the active layer components. However, their morphological details are notoriously difficult to distinguish due to the low electron contrast difference between the components. Phase-sensitive neutron reflectivity (PSNR) is uniquely suited to characterize these systems due to the large, natural scattering length density difference between two common device materials, poly (3-hexylthiophene) and [6,6]-phenyl-C61-butyric acid methyl ester (PCBM). Using PSNR we find a high concentration of PCBM at the substrate and near but not at the air interface. Herein we discuss the method of applying PSNR to polymer-based solar cells, the results obtained, and an evaluation of its effectiveness. (C) 2010 American Institute of Physics. [doi:10.1063/1.3471583]

引用

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