In situ TEM observations of fast grain-boundary motion in stressed nanocrystalline aluminum films

被引：397

作者：

Legros, Marc ^{[1
]}

Gianola, Daniel S. ^{[2
]}

Hemker, Kevin J. ^{[2
]}

机构：

[1] CNRS, CEMES, F-31055 Toulouse, France

[2] Johns Hopkins Univ, Baltimore, MD 21218 USA

来源：

ACTA MATERIALIA | 2008年 / 56卷 / 14期

关键词：

in situ transmission electron microscopy (TEM); grain-boundary migration; nanocrystalline film; aluminum;

D O I：

10.1016/j.actamat.2008.03.032

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Free-standing nanocrystalline Al thin films have been strained in situ in a transmission electron microscope at room-temperature. Extensive grain-boundary migration accompanies the in situ loading and has been observed to occur preferentially at crack tips and only in the presence of the applied stress. This grain growth precedes dislocation activity, and measured boundary velocities are greater than can be explained by diffusive processes. The unambiguous observations of stress-assisted grain growth are compatible with recently proposed models for stress-coupled grain-boundary migration. The growth occurs in a faceted manner indicative of preferential boundaries. The fast collapse of small grains with sizes of 30-50 nm demonstrates the unstable nature of a nanocrystalline structure. Clearly observable shape changes testify to the effectiveness of grain-boundary migration as a deformation mechanism, and preferential grain growth at crack tips resulted in efficient crack tip blunting, which is expected to improve the films' fracture toughness. (c) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：3380 / 3393

页数：14

共 89 条

[1] Microstructure and mechanical behavior of nanocrystalline metals [J].