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Doping in carbon nanotubes probed by Raman and transport measurements
被引:147
作者:
Das, Anindya
[1
]
Sood, A. K.
Govindaraj, A.
Saitta, A. Marco
Lazzeri, Michele
Mauri, Francesco
Rao, C. N. R.
机构:
[1] Indian Inst Sci, Dept Phys, Bangalore 560012, Karnataka, India
[2] Jawaharlal Nehru Ctr Adv Sci Res, Chem Phys Mat Unit, Bangalore 560064, Karnataka, India
[3] Univ Paris 06, IMPMC, CNRS, IPGP, F-75015 Paris, France
[4] Univ Paris 07, IMPMC, CNRS, IPGP, F-75015 Paris, France
关键词:
D O I:
10.1103/PhysRevLett.99.136803
中图分类号:
O4 [物理学];
学科分类号:
0702 ;
摘要:
In situ Raman experiments together with transport measurements have been carried out on carbon nanotubes as a function of gate voltage. In metallic tubes, a large increase in the Raman frequency of the G(-) band, accompanied by a substantial decrease of its linewidth, is observed with electron or hole doping. In addition, we see an increase in the Raman frequency of the G(+) band in semiconducting tubes. These results are quantitatively explained using ab initio calculations that take into account effects beyond the adiabatic approximation. Our results imply that Raman spectroscopy can be used as an accurate measure of the doping of both metallic and semiconducting nanotubes.
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