Diffusion-limited and asymmetric growth of amorphous layer in Ni/Zr bilayer upon annealing

被引:5
作者
Lai, WS
Liu, BX [1 ]
机构
[1] Tsing Hua Univ, Dept Mat Sci & Engn, Beijing 100084, Peoples R China
[2] Nanjing Univ, State Key Lab Solid State Microstruct Phys, Nanjing 210093, Peoples R China
基金
中国国家自然科学基金;
关键词
D O I
10.1557/JMR.1998.0237
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Asymmetric growth of amorphous layer in a Ni/Zr bilayer, in which a thin disordered interlayer is preset, upon annealing at medium temperatures is observed by molecular-dynamics simulation with an n-body potential, It is shown that the amorphous layer is extended from the interlayer with different speeds toward two opposite directions and that the growth kinetics follows time dependence of t(1/2), indicating amorphization upon annealing in the Ni/Zr bilayer is indeed through a diffusion-limited reaction. Besides, two low temperature limits allowing the growth of amorphous layer toward Ni and Zr layers are also obtained.
引用
收藏
页码:1712 / 1716
页数:5
相关论文
共 19 条
[1]   COMPUTATIONAL STUDY OF STRUCTURAL-CHANGE THROUGH THE GLASS-TRANSITION IN AN AMORPHOUS AND LIQUID ZR-NI ALLOY [J].
AIHARA, T ;
AOKI, K ;
MASUMOTO, T .
SCRIPTA METALLURGICA ET MATERIALIA, 1993, 28 (08) :1003-1008
[2]   CRYSTALLIZATION CHARACTERISTICS OF NI-ZR METALLIC GLASSES FROM NI20ZR80 TO NI70ZR30 [J].
ALTOUNIAN, Z ;
TU, GH ;
STROMOLSEN, JO .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (06) :3111-3116
[3]  
Bakker H., 1989, Diffusion and Defect Data - Solid State Data, Part A (Defect and Diffusion Forum), V66-69, P1169
[4]   FACE-CENTRED CUBIC MODIFICATION IN SPUTTERED FILMS OF TANTALUM MOLYBDENUM TUNGSTEN RHENIUM HAFNIUM AND ZIRCONIUM [J].
CHOPRA, KL ;
RANDLETT, MR ;
DUFF, RH .
PHILOSOPHICAL MAGAZINE, 1967, 16 (140) :261-&
[5]   SOLID-STATE REACTION AND STRUCTURE IN COMPOSITIONALLY MODULATED ZIRCONIUM-NICKEL AND TITANIUM-NICKEL FILMS [J].
CLEMENS, BM .
PHYSICAL REVIEW B, 1986, 33 (11) :7615-7624
[6]   CALORIMETRIC STUDY OF AMORPHIZATION IN PLANAR, BINARY, MULTILAYER, THIN-FILM DIFFUSION COUPLES OF NI AND ZR [J].
COTTS, EJ ;
MENG, WJ ;
JOHNSON, WL .
PHYSICAL REVIEW LETTERS, 1986, 57 (18) :2295-2298
[7]  
DEVANATHAN R, 1993, MATER RES SOC SYMP P, V291, P653
[8]   ATOMISTIC SIMULATION OF DEFECT-INDUCED AMORPHIZATION OF BINARY LATTICES [J].
HSIEH, H ;
YIP, S .
PHYSICAL REVIEW B, 1989, 39 (11) :7476-7491
[9]   AMORPHIZATION INDUCED BY CHEMICAL DISORDER IN CRYSTALLINE NIZR2 - A MOLECULAR-DYNAMICS STUDY BASED ON AN N-BODY POTENTIAL [J].
MASSOBRIO, C ;
PONTIKIS, V ;
MARTIN, G .
PHYSICAL REVIEW LETTERS, 1989, 62 (10) :1142-1145
[10]   MAXIMUM THICKNESS OF AMORPHOUS NIZR INTERLAYERS FORMED BY A SOLID-STATE REACTION TECHNIQUE [J].
MENG, WJ ;
NIEH, CW ;
JOHNSON, WL .
APPLIED PHYSICS LETTERS, 1987, 51 (21) :1693-1695