Conductivity, morphology, interfacial chemistry, and stability of poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate): A photoelectron spectroscopy study

被引：484

作者：

Crispin, X ^{[1
]}

Marciniak, S

Osikowicz, W

Zotti, G

Van der Gon, AWD

Louwet, F

Fahlman, M

Groenendaal, L

De Schryver, F

Salaneck, WR

机构：

[1] Linkoping Univ, Dept Phys & Measurement Technol, S-58183 Linkoping, Sweden

[2] Inst Consiglio Nazl Ric Energet & Interfasi, Co Stati Uniti 4, I-35127 Padua, Italy

[3] Eindhoven Univ Technol, Fac Appl Phys, NL-5600 MB Eindhoven, Netherlands

[4] Agfa Gevaert NV, R&D Mat Res, Dept Chem, B-2640 Mortsel, Belgium

[5] Linkoping Univ, Dept Sci & Technol, S-60174 Norrkoping, Sweden

[6] Katholieke Univ Leuven, Afdeling Fotochem & Spect, B-3001 Heverlee, Belgium

来源：

JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS | 2003年 / 41卷 / 21期

关键词：

ESCA/XPS; poly(3,4-ethylene dioxythiophene); conductivity; degradation; interfacial chemistry; conducting polymers;

D O I：

10.1002/polb.10659

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

X-ray photoelectron spectroscopy (XPS) has been used to characterize poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate) (PEDT/PSS), one of the most common electrically conducting organic polymers. A correlation has been established between the composition, morphology, and polymerization mechanism, on the one hand, and the electric conductivity of PEDT/PSS, on the other hand. XPS has been used to identify interfacial reactions occurring at the polymer-on-ITO and polymer-on-glass interfaces, as well as chemical changes within the polymer blend induced by electrical stress and exposure to ultraviolet light. (C) 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 2561-2583, 2003

引用

页码：2561 / 2583

页数：23

共 168 条

[1] Structure of thin films of poly(3,4-ethylenedioxythiophene)
Aasmundtveit, KE
Samuelsen, EJ
Pettersson, LAA
Inganäs, O
Johansson, T
Feidenhans, R
[J]. SYNTHETIC METALS, 1999, 101 (1-3) : 561 - 564
[2] MECHANISMS OF PHOTODEGRADATION OF POLY(3-ALKYLTHIOPHENES) IN SOLUTION
ABDOU, MSA
HOLDCROFT, S
[J]. MACROMOLECULES, 1993, 26 (11) : 2954 - 2962
[3] PHOTOIMAGING OF ELECTRONICALLY CONDUCTING POLYMERIC NETWORKS
ABDOU, MSA
DIAZGUIJADA, GA
ARROYO, MI
HOLDCROFT, S
[J]. CHEMISTRY OF MATERIALS, 1991, 3 (06) : 1003 - 1006
[4] Metallic conductivity at low temperatures in poly(3,4-ethylenedioxythiophene) doped with PF6
Aleshin, A
Kiebooms, R
Menon, R
Wudl, F
Heeger, AJ
[J]. PHYSICAL REVIEW B, 1997, 56 (07) : 3659 - 3663
[5] Metallic conductivity of highly doped poly(3,4-ethylenedioxythiophene)
Aleshin, AN
Kiebooms, R
Heeger, AJ
[J]. SYNTHETIC METALS, 1999, 101 (1-3) : 369 - 370
[6] Conductivity and magnetoconductivity below 1 K in films of poly(3,4-ethylenedioxythiophene) doped with CF3SO3
Aleshin, AN
Kiebooms, R
Yu, H
Levin, M
Shlimak, I
[J]. SYNTHETIC METALS, 1998, 94 (02) : 157 - 159
[7] Chemical interactions at polymer interfaces:: poly(p-xylylene-α-tetrahydrothiophene-bromide, chloride) on indium-tin-oxide
Andersson, A
Kugler, T
Lögdlund, M
Holmes, AB
Li, X
Salaneck, WR
[J]. SYNTHETIC METALS, 1999, 106 (01) : 13 - 17
[8] Halogens as trace compounds in polymeric light-emitting diodes
Andersson, G
Brongersma, HH
van der Gon, AWD
van IJzendoorn, LJ
de Jong, MP
de Voigt, MJA
[J]. SYNTHETIC METALS, 2000, 113 (03) : 245 - 249
[9] Andersson P, 2002, ADV MATER, V14, P1460, DOI 10.1002/1521-4095(20021016)14:20<1460::AID-ADMA1460>3.0.CO
[10] 2-S

← 1 2 3 4 5 6 7 8 9 10 →