Microcavity single-photon-emitting diode

被引:72
作者
Bennett, AJ
Unitt, DC
See, P
Shields, AJ
Atkinson, P
Cooper, K
Ritchie, DA
机构
[1] Toshiba Res Europe Ltd, Cambridge Res Lab, Cambridge CB4 0WE, England
[2] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1063/1.1921332
中图分类号
O59 [应用物理学];
学科分类号
摘要
We show that a planar semiconductor cavity can be used to enhance by a factor of ten the efficiency with which photons are collected from an electrically driven single InAs/GaAs quantum dot. Under a fixed bias we observe that the photon statistics change when the injection current is modified. The observed bunching of photons from the biexciton state can be explained by the presence of charged states or dark states within the quantum dot with lifetimes greater than 4 ns. Single-photon emission from both the exciton and biexciton states is demonstrated under pulsed electrical injection. (c) 2005 American Institute of Physics.
引用
收藏
页码:1 / 3
页数:3
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