Failure analysis of micro-heating elements suspended on thin membranes

被引:20
作者
Briand, D
Beaudoin, F
Courbat, J
de Rooij, NF
Desplats, R
Perdu, P
机构
[1] Univ Neuchatel, Inst Microtechnol, CH-2000 Neuchatel, Switzerland
[2] CNES, THALES Lab, Toulouse, France
关键词
D O I
10.1016/j.microrel.2005.07.106
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report on the degradation of platinum micro-heating elements operating at high temperatures. Devices with platinum heaters suspended on micro-machined dielectric membranes were self-heated at high temperature until failure. Optical and SEM observations combined with mechanical deformation measurements and Thermal Laser Stimulation techniques were used to analyze the failure mechanisms of the micro-heating elements. Platinum atoms migration and breaking of the membrane were two failure modes observed. At high temperature, the migration of the platinum atoms was linked to the mechanical stress in the dielectric membrane. The Thermal Laser Stimulation technique revealed the formation of vertical as well as lateral thermocouples at mechanically deformed areas. One explanation proposed is that those thermocouples are the result of Si diffusion from the Si3N4 membrane into the platinum heater as well as electrostress migration of platinum atoms. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1786 / 1789
页数:4
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