Nonequilibrium green's function treatment of phonon scattering in carbon-nanotube transistors

被引:143
作者
Koswatta, Siyuranga O. [1 ]
Hasan, Sayed
Lundstrom, Mark S.
Anantram, M. P.
Nikonov, Dmitri E.
机构
[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
[2] Texas Instruments Inc, Silicon Technol Dev Grp, Dallas, TX 75243 USA
[3] Univ Waterloo, Dept Elect & Comp Engn, Nanotechnol Engn Grp, Waterloo, ON N2L 3G1, Canada
[4] Intel Corp, Technol & Mfg Grp, Santa Clara, CA 95052 USA
关键词
carbon nanotube; dissipative transport; non-equilibrium Green's function (NEGF); phonon scattering; quantum transport; transistor; BAND-STRUCTURE; SINGLE; TRANSPORT; MOBILITY;
D O I
10.1109/TED.2007.902900
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present a detailed treatment of dissipative quantum transport in carbon-nanotube field-effect transistors (CNT-FETs) using the nonequilibrium Green's function formalism. The effect of phonon scattering on the device characteristics of CNT-FETs is explored using extensive numerical simulation. Both intra-and intervalley scattering mediated by acoustic (AP), optical (OP), and radial-breathing-mode (RBM) phonons are treated. Realistic phonon dispersion calculations are performed using force-constant methods, and electron-phonon coupling is determined through microscopic theory. Specific simulation results are presented for (16,0), (19,0), and (22,0) zigzag CNT-FETs, which are in the experimentally useful diameter range. We find that the effect of phonon scattering on device performance has a distinct bias dependence. Up to moderate gate biases, the influence of high-energy OP scattering is suppressed, and the device current is reduced due to elastic backscattering by AP and low-energy RBM phonons. At large gate biases, the current degradation is mainly due to high-energy OP scattering. The influence of both AP and high-energy OP scattering is reduced for larger diameter tubes. The effect of RBM mode, however, is nearly independent of the diameter for the tubes studied here.
引用
收藏
页码:2339 / 2351
页数:13
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