Attenuated total reflection Fourier transform infrared spectroscopy study of poly(methyl methacrylate) adsorption on a silica thin film: Polymer/surface interactions

被引：36

作者：

Berquier, JM ^{[1
]}

Arribart, H ^{[1
]}

机构：

[1] Lab CNRS St Gobain, F-93304 Aubervilliers, France

来源：

LANGMUIR | 1998年 / 14卷 / 13期

关键词：

D O I：

10.1021/la9703961

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A very sensitive Fourier transform infrared spectroscopy attenuated total reflection experiment was used to study the adsorbed polymer layer at the surface of a thin silica film. Two types of poly(methyl methacrylate)/surface interactions were identified. Bands due to the free and perturbated silanols at the silica surface were observed. The number of isolated silanols involved in the adsorption process was estimated between 1 and 2 silanol/nm2 which is in good agreement with the data on dispersed silica.

引用

页码：3716 / 3719

页数：4