共 12 条
- [1] ANISOTROPY IN THIN-FILMS - MODELING AND MEASUREMENT OF GUIDED AND NONGUIDED OPTICAL-PROPERTIES - APPLICATION TO TIO2 FILMS [J]. APPLIED OPTICS, 1993, 32 (28): : 5649 - 5659
- [2] Empirical equations for the principal refractive indices and column angle of obliquely deposited films of tantalum oxide, titanium oxide, and zirconium oxide [J]. APPLIED OPTICS, 1998, 37 (13): : 2653 - 2659
- [3] MEASUREMENT OF THE PRINCIPAL REFRACTIVE-INDEXES OF THIN-FILMS DEPOSITED AT OBLIQUE-INCIDENCE [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1985, 2 (10): : 1693 - 1697
- [4] HODGKINSON IJ, 1998, BIREFRINGENT THIN FI
- [5] HODGKINSON IJ, 1994, P SOC PHOTO-OPT INS, V2253, P882
- [6] ENVELOPE AND WAVE-GUIDE METHODS - A COMPARATIVE-STUDY OF PBF2 AND CEO2 BIREFRINGENT FILMS [J]. APPLIED OPTICS, 1994, 33 (13): : 2659 - 2663
- [7] Janchen H., 1996, Pure and Applied Optics, V5, P405, DOI 10.1088/0963-9659/5/4/007
- [9] THIN-FILM RETARDATION PLATE BY OBLIQUE DEPOSITION [J]. APPLIED OPTICS, 1989, 28 (13): : 2466 - 2482