Monitoring surface charge migration in the spectral dynamics of single CdSe/CdS nanodot/nanorod heterostructures -: art. no. 205339

Spherical CdSe nanocrystals capped by a CdS rod-like shell exhibit interesting spectral dynamics on the single particle level. Spectral boxcar averaging reveals a high degree of correlation between the emission energy, spectral linewidth, phonon coupling strength, and emission intensity of the single nanocrystal. The results can be described in terms of a spatially varying surface charge density in the vicinity of the exciton localized in the CdSe core, leading to a quantum confined Stark effect which modifies the transition energy and the radiative rate. Whereas internal charging of the particle results in a change in the nonradiative rate, surface charges primarily influence the radiative rate. Additionally, we observe characteristic spectral dynamics in frequency space, the magnitude of which depends slightly on temperature and strongly on excitation density. By distinguishing between continuous spectral jitter and discrete spectral jumping associated with a reversible particle ionization event, we can attribute the spectral dynamics to either a slowly varying surface charge density or a rapidly occurring polarization change due to a reversible expulsion of a charge carrier from the semiconductor nanostructure. Whereas the former exhibits universal Gaussian statistics, the latter is best characterized by a Lorentzian noise spectrum. The Gaussian spectral noise increases with spectral redshift of the emission and with increasing proximity of the surface charge to the localized exciton. The observation of a high degree of correlation between peak position and linewidth right up to room temperature suggests applications of the nanocrystals as extremely sensitive single charge detectors in both solid state devices and in biomolecular labeling, where highly local measurements of the dielectric environment are required. Nanoscale control of the physical shape of nanocrystals provides a versatile test bed for studying electronic noise, making the approach relevant to a wide range of conducting and emissive solid state systems.