SEU induced errors observed in microprocessor systems

被引：23

作者：

Asenek, V ^{[1
]}

Underwood, C

Velazco, R

Rezgui, S

Oldfield, M

Cheynet, P

Ecoffet, R

机构：

[1] Univ Surrey, Surrey Space Ctr, Guildford GU2 5XH, Surrey, England

[2] TIMA Lab, Qualificat Grp, F-38031 Grenoble, France

[3] Ctr Natl Etud Spatiales, CT, AQCA, F-31055 Toulouse, France

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1998年 / 45卷 / 06期

关键词：

D O I：

10.1109/23.736542

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, we present software tools for predicting the rate and nature of observable SEU induced errors in microprocessor systems. These tools are built around a commercial microprocessor simulator and are used to analyse real satellite application systems. Results obtained from simulating the nature of SEU induced errors are shown to correlate with ground-based radiation test data.

引用

页码：2876 / 2883

页数：8

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