A METHOD FOR CHARACTERIZING A MICROPROCESSORS VULNERABILITY TO SEU

被引：29

作者：

ELDER, JH

OSBORN, J

KOLASINSKI, WA

KOGA, R

机构：

[1] Aerosp Corp, Los Angeles, CA, USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1988年 / 35卷 / 06期

关键词：

D O I：

10.1109/23.25521

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Computers, Microcomputer

引用

页码：1678 / 1681

页数：4

共 6 条

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CUSICK, J ;

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KING, C .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) :4206-4211

[2] THE SEU RISK ASSESSMENT OF Z80A, 8086 AND 80C86 MICROPROCESSORS INTENDED FOR USE IN A LOW ALTITUDE POLAR ORBIT [J].

HARBOESORENSEN, R ;

ADAMS, L ;

DALY, EJ ;

SANSOE, C ;

MAPPER, D ;

SANDERSON, TK .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) :1626-1631

[3]

NEWBERRY D, 1986, 4TH ANN SINGL EV S

[4]

PRICE WE, 1981, IEEE T NUCL SCI, V28, P3946

[5] THE SEU AND TOTAL DOSE-RESPONSE OF THE INMOS TRANSPUTER [J].

THOMLINSON, J ;

ADAMS, L ;

HARBOESORENSEN, R .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1987, 34 (06) :1803-1807

[6]

Turing AM, 1937, P LOND MATH SOC, V42, P230, DOI 10.1112/plms/s2-42.1.230

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