SEU VULNERABILITY OF THE ZILOG Z-80 AND NSC-800 MICROPROCESSORS

被引:11
作者
CUSICK, J [1 ]
KOGA, R [1 ]
KOLASINSKI, WA [1 ]
KING, C [1 ]
机构
[1] AEROSPACE CORP,SPACE SCI LAB,LOS ANGELES,CA 90009
关键词
D O I
10.1109/TNS.1985.4334095
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:4206 / 4211
页数:6
相关论文
共 17 条
[2]  
ADAMS JH, 1981, NRL4506 MEM REP
[3]  
ADAMS JH, 1983, NRL5099 MEM REP
[4]   MICROVOLUME ENERGY DEPOSITION FROM HIGH-ENERGY PROTON-SILICON REACTIONS [J].
BRADFORD, JN .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (06) :2085-2089
[5]   SINGLE EVENT UPSET TESTING WITH RELATIVISTIC HEAVY-IONS [J].
CRISWELL, TL ;
MEASEL, PR ;
WAHLIN, KL .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (06) :1559-1562
[6]   SINGLE EVENT UPSET RATE PREDICTIONS FOR COMPLEX LOGIC SYSTEMS [J].
DIEHLNAGLE, SE ;
VINSON, JE ;
PETERSON, EL .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (06) :1132-1138
[7]  
EDMONDS L, 1985, JPL8498 PUBL
[8]   SINGLE EVENT UPSETS IN NMOS MICROPROCESSORS [J].
GUENZER, CS ;
CAMPBELL, AB ;
SHAPIRO, P .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) :3955-3958
[9]   SINGLE EVENT UPSET OF DYNAMIC RAMS BY NEUTRONS AND PROTONS [J].
GUENZER, CS ;
WOLICKI, EA ;
ALLAS, RG .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (06) :5048-5053
[10]   ANNEALING OF TOTAL DOSE DAMAGE IN THE Z80A-MICROPROCESSOR [J].
JOHNSTON, AH .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4251-4255