SINGLE EVENT UPSET RATE PREDICTIONS FOR COMPLEX LOGIC SYSTEMS

被引：20

作者：

DIEHLNAGLE, SE ^{[1
]}

VINSON, JE ^{[1
]}

PETERSON, EL ^{[1
]}

机构：

[1] USN, RES LAB, WASHINGTON, DC 20375 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1984年 / 31卷 / 06期

关键词：

D O I：

10.1109/TNS.1984.4333470

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1132 / 1138

页数：7

共 14 条

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[9] CALCULATION OF COSMIC-RAY INDUCED SOFT UPSETS AND SCALING IN VLSI DEVICES [J].

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IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (06) :2055-2063

[10] SUGGESTED SINGLE EVENT UPSET FIGURE OF MERIT [J].

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IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4533-4539

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