Quantitative convergent beam electron diffraction measurements of low-order structure factors in copper

被引:11
作者
Friis, J [1 ]
Jiang, B
Spence, JCH
Holmestad, R
机构
[1] Norwegian Univ Sci & Technol, Dept Phys, NTNU, N-7491 Trondheim, Norway
[2] Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA
关键词
quantitative convergent beam electron diffraction; QCBED; structure factor; copper; bonding; free electron model;
D O I
10.1017/S1431927603030319
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Accurate low-order structure factors for copper metal have been measured by quantitative convergent beam electron diffraction (QCBED). The standard deviation of the measured structure factors is equal to or smaller than the most accurate measurement by any other method, including X-ray single crystal Pendellosung, Bragg gamma-ray diffraction, and high-energy electron diffraction. The electron structure factor for the (440) reflection was used to determine the Debye-Waller (DW) factor. The local heating of the specimen by the electron beam is determined to be 5 K under the current illumination conditions. The low-order structure factors for copper measured by different methods are compared and discussed. The new data set is used to test band theory and to obtain a charge density map. The charge deformation map shows a charge surplus between the atoms and agrees fairly well with the simple model of copper 2+ ions at the atomic sites in a sea of free uniformly distributed electrons.
引用
收藏
页码:379 / 389
页数:11
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