Measuring errors in single-qubit rotations by pulsed electron paramagnetic resonance

被引:41
作者
Morton, JJL
Tyryshkin, AM
Ardavan, A
Porfyrakis, K
Lyon, SA
Briggs, GAD
机构
[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
[2] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA
[3] Univ Oxford, Dept Phys, Clarendon Lab, Oxford OX1 3PU, England
来源
PHYSICAL REVIEW A | 2005年 / 71卷 / 01期
关键词
D O I
10.1103/PhysRevA.71.012332
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The ability to measure and reduce systematic errors in single-qubit logic gates is crucial when evaluating quantum computing implementations. We describe pulsed electron paramagnetic resonance (EPR) sequences that can be used to measure precisely even small systematic errors in rotations of electron-spin-based qubits. Using these sequences we obtain values for errors in the rotation angle and axis for single-qubit rotations using a commercial EPR spectrometer. We conclude that errors in qubit operations by pulsed EPR are not limiting factors in the implementation of electron-spin-based quantum computers.
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页数:5
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