Paracrystallites found in evaporated amorphous tetrahedral semiconductors

被引:142
作者
Treacy, MMJ
Gibson, JM
Keblinski, PJ
机构
[1] NEC Res Inst Inc, Princeton, NJ 08540 USA
[2] Univ Illinois, Dept Phys, Urbana, IL 61801 USA
[3] Univ Illinois, Dept Mat Sci, Urbana, IL 61801 USA
[4] Argonne Natl Labs, Argonne, IL 60439 USA
关键词
D O I
10.1016/S0022-3093(98)00371-8
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Variable coherence microscopy shows that as-deposited amorphous germanium and silicon contain medium-range order. The ordering can be explained by a fine-grained paracrystallite material in which intergranular stress has been relaxed by deformation. On annealing, the paracrystallite structure transforms towards the lower-energy continuous random network (CRN). We present data on a variety of vacuum-evaporated samples, and on molecular dynamics simulations of candidate structures. (C) 1998 Elsevier Science B.V. All rights reserved.
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页码:99 / 110
页数:12
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