Structural and optical studies of MgxZn1-xOfilms grown on sapphire

被引：10

作者：

Chen, NB ^{[1
]}

Wu, HZ

Qiu, DJ

机构：

[1] Zhejiang Univ, Dept Phys, Hangzhou 310028, Peoples R China

[2] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China

来源：

ACTA PHYSICA SINICA | 2004年 / 53卷 / 01期

关键词：

reactive e-beam evaporation; Mg(x)Zn(1-x)Othin films; structural and optical properties;

D O I：

10.7498/aps.53.311

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Low-temperature epitaxy of MgxZn1-xO thin films is achieved on sapphire substrates by the reactive electron beam evaporation. X-ray diffraction (XRD) and energy dispersive x-ray (EDX) analyses of the films demonstrate that the structure of MgxZn1-xO depends upon the concentration of Mg in the films. With the increase of Mg concentration, the structure of MgxZn1-xO changes from the wurtzite crystal structure of ZnO to the cubic one with lattice constant similar to that of MgO. By the measurements of UV-visible transmission and ultraviolet photoluminescence spectra of the MgxZn1-xO films, it is found that the absorption band edge of MgxZn1-xO is blue shifted obviously with the increase of Mg concentration, indicating the absorption band edge of MgxZn1-xO becomes wider. However, the lattice mismatch between cubic MgxZn1-xO film and MgO is small (0.16%).

引用

页码：311 / 315

页数：5

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