Two-dimensional electron gas and persistent photoconductivity in AlxGa1-xN/GaN heterostructures

被引:34
作者
Lin, TY [1 ]
Chen, HM
Tsai, MS
Chen, YF
Fang, FF
Lin, CF
Chi, GC
机构
[1] Natl Taiwan Univ, Dept Phys, Taipei, Taiwan
[2] Natl Taiwan Univ, Ctr Condensed Matter Sci, Taipei 10764, Taiwan
[3] Natl Cent Univ, Dept Phys, Chung Li, Taiwan
来源
PHYSICAL REVIEW B | 1998年 / 58卷 / 20期
关键词
D O I
10.1103/PhysRevB.58.13793
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present results of electrical and optical measurements in an AlxGa1-xN/GaN heterostructure. The presence of a two-dimensional electron gas at the high-quality AlxGa1-xN/GaN heterointerface is confirmed by Shubnikov-de Haas measurement, which shows well-resolved magnetoresistance oscillations starting in fields below 3 T at 1.3 K. From the temperature dependence of the oscillation amplitude, the obtained effective mass (0.24+/-0.02)m(0) is in excellent agreement with the value of cyclotron resonance measurements in two-dimensional (2D) systems, but larger than the values of theoretical and experimental results in GaN bulk films. We point out that the effective-mass enhancement in 2D systems is due to the effects of band nonparabolicity and wave-function penetration into the barrier material. The results of photoconductivity measurements reveal that persistent photoconductivity (PPC) does exist in the AlxGa1-xN/GaN heterostructure, and that the PPC behavior of AlxGa1-xN/GaN heterojunction is quite different from that of the GaN epitaxial thin films. A possible mechanism is presented to interpret the observed PPC effect. [S0163-1829(98)07843-7].
引用
收藏
页码:13793 / 13798
页数:6
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