Effects of inhomogeneous flux pinning strength and flux flow on scaling of current-voltage characteristics in high-temperature superconductors

被引：47

作者：

Matsushita, T

Tohdoh, T

Ihara, N

机构：

[1] Dept. of Comp. Sci. and Electronics, Kyushu Institute of Technology, Iizuka 820

[2] Seibu Regn., Int. Business Machines, Hakata-ku, Fukuoka 812

来源：

PHYSICA C | 1996年 / 259卷 / 3-4期

关键词：

D O I：

10.1016/0921-4534(96)00056-1

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The scaling of the current-voltage characteristics is examined theoretically using the Bur-creep model with taking account of the effects of distributed flux- pinning strength and flux flow for thin-film high-temperature superconductors in the perpendicular magnetic field. It is found that the scaling is obtained also for the theoretical result from the flux-creep model. At the same time the obtained dynamic and static critical indices become close to experimental results by taking account of these two effects. A quantitative agreement is obtained also for the ''transition'' line in a Bi-2223 thin film. It is concluded that the mechanism of Aux pinning, creep and flow explains the dynamic behavior of thermally activated flux lines. The reason why such a scaling is derived also from the mechanism of flux pinning, creep and flow is argued.

引用

页码：321 / 325

页数：5