Field cooling induced changes in the antiferromagnetic structure of NiO films

被引:91
作者
Zhu, W
Seve, L
Sears, R
Sinkovic, B
Parkin, SSP
机构
[1] Univ Connecticut, Dept Phys, Storrs, CT 06269 USA
[2] Brookhaven Natl Lab, Dept Phys, Upton, NY 11973 USA
[3] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA
关键词
D O I
10.1103/PhysRevLett.86.5389
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The magnetic anisotropy in antiferromagnetic 500 Angstrom thick NiO films, before and after the establishment of an exchange bias field with Co84Fe16 ferromagnetic layers, was measured using magnetic linear dichroism in soft x-ray absorption. Both < 111 > textured NiO and untextured NiO films show exchange-bias induced in-plane magnetic anisotropy of nearly equal magnitude and with the Ni moment axis being nearly parallel to the exchange bias field direction. These results represent the first observation of the key step in the exchange biasing process, namely, repopulation of the antiferromagnetic domains whose magnetization axis is closest to the exchange bias field direction.
引用
收藏
页码:5389 / 5392
页数:4
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